Analysis of organic multilayered samples for optoelectronic devices by (low-energy) dynamic SIMS
نویسندگان
چکیده
منابع مشابه
study of cohesive devices in the textbook of english for the students of apsychology by rastegarpour
this study investigates the cohesive devices used in the textbook of english for the students of psychology. the research questions and hypotheses in the present study are based on what frequency and distribution of grammatical and lexical cohesive devices are. then, to answer the questions all grammatical and lexical cohesive devices in reading comprehension passages from 6 units of 21units th...
Organic Vapor Phase Deposition for Optoelectronic Devices
The growth of molecular organic thin films by the process of organic vapor phase deposition (OVPD) was initiated by Professor Steve Forrest OVPD transports organic molecules to a cold substrate by a hot inert carrier gas. It has proven useful for the deposition of organic semiconductors, and is capable of patterned growth with micron resolution. Professors Benziger and Forrest collaborated to e...
متن کاملOrganic optoelectronic devices-flexibility versus performance
In this paper, we discuss the effect of flexible substrates on the characteristics of two organic optoelectronic devices, namely P3HT:PCBM-based photovoltaic bulk heterojunctions and pentacene-based phototransistors. In addition, we have developed anode materials deposited by ion beam sputtering, a technique which satisfies the low temperature deposition requirements associated with the use of ...
متن کاملSIMS Fingerprint Analysis on Organic Substrates .
ToF-SIMS has been used in the analysis of latent fingerprints (dactyloscopy) with a view to use in forensic and biomedical applications. Szynkowska et al have demonstrated that SIMS can be employed to produce images of whole fingerprints on inorganic surfaces such as steel, brass and glass (1). We demonstrate the detection of a range of exogenous materials in fingerprints including industrial l...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Surface and Interface Analysis
سال: 2010
ISSN: 0142-2421
DOI: 10.1002/sia.3451